I was just Informed of a phenomenom that I was not aware of, its called RBI or Random Bulk Image.
Here is an explantion of the phenomenom for which I hope it does not apply in my case!
Residual Bulk Image. It happens when NIR and other long wavelength photons form their photoelectrons outside of the depletion region associated with the pixels. The elecrons are not confined to any particular pixel so they drift around under thermal diffusion and mutual repulsion and some will wind up being trapped at the interface between the epitaxial layer atop the wafer and the base substrate. There are trapping sites there.
when you take subsequent images some of these trapped elecrons will leak out and will leave "ghost images" in your following images, be they darks or light exposures. the longer the following exposure the more time the trap has to leak.
This is a clear issue with a number of sensors and I bring it up because it is worth considering that you may be seeing RBI.
I now have a total of 4 images all taken at different times, with different cameras and, different scales, what are the Odds, and does anyone know how to rule this out with 4 other confirming images?
Whats needed now is a method of rescaling all images to the same and applying a grid overlay to determine its exact position.
Unfortunately I am also having trouble getting the actual fits format data that these correlating images were taken in.
Wow, what a learning expierience it has been so far.
Dennis